Author of the publication

Modeling the Interdependences Between Voltage Fluctuation and BTI Aging.

, , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (7): 1652-1665 (2019)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Modeling the Interdependences Between Voltage Fluctuation and BTI Aging., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (7): 1652-1665 (2019)On the Workload Dependence of Self-Heating in FinFET Circuits., , , and . IEEE Trans. Circuits Syst. II Express Briefs, 67-II (10): 1949-1953 (2020)Massively Parallel Circuit Setup in GPU-SPICE., , , and . IEEE Trans. Computers, 72 (8): 2127-2138 (August 2023)Special Session: Machine Learning for Semiconductor Test and Reliability., , , , , , , , , and . VTS, page 1-11. IEEE, (2021)Reliability Challenges with Self-Heating and Aging in FinFET Technology., , , , , , and . IOLTS, page 68-71. IEEE, (2019)Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 31 (9): 1280-1293 (September 2023)NCFET to Rescue Technology Scaling: Opportunities and Challenges., , , , and . ASP-DAC, page 637-644. IEEE, (2020)Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient., , , , and . IEEE Access, (2021)FN-CACTI: Advanced CACTI for FinFET and NC-FinFET Technologies., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 30 (3): 339-352 (2022)Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths., , , , , and . IRPS, page 1-6. IEEE, (2023)