%0 Conference Paper %1 conf/iscas/ChenKJHL09 %A Chen, Wen-Yi %A Ker, Ming-Dou %A Jou, Yeh-Ning %A Huang, Yeh-Jen %A Lin, Geeng-Lih %B ISCAS %D 2009 %I IEEE %K dblp %P 385-388 %T Improvement on ESD Robustness of Lateral DMOS in High-voltage CMOS ICs by Body Current Injection. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2009.html#ChenKJHL09 %@ 978-1-4244-3828-0

@inproceedings{conf/iscas/ChenKJHL09, added-at = {2011-06-28T00:00:00.000+0200}, author = {Chen, Wen-Yi and Ker, Ming-Dou and Jou, Yeh-Ning and Huang, Yeh-Jen and Lin, Geeng-Lih}, biburl = {https://www.bibsonomy.org/bibtex/2496122fff6baa051457037557410e597/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/2009}, ee = {http://dx.doi.org/10.1109/ISCAS.2009.5117766}, interhash = {1358abce83d51316235224c9eee4ad5f}, intrahash = {496122fff6baa051457037557410e597}, isbn = {978-1-4244-3828-0}, keywords = {dblp}, pages = {385-388}, publisher = {IEEE}, timestamp = {2016-05-21T11:41:44.000+0200}, title = {Improvement on ESD Robustness of Lateral DMOS in High-voltage CMOS ICs by Body Current Injection.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2009.html#ChenKJHL09}, year = 2009 }