%0 Conference Paper %1 conf/irps/YamaguchiFOS20 %A Yamaguchi, Marina %A Fujii, Shosuke %A Ota, Kensuke %A Saitoh, Masumi %B IRPS %D 2020 %I IEEE %K dblp %P 1-6 %T Breakdown Lifetime Analysis of HfO2-based Ferroelectric Tunnel Junction (FTJ) Memory for In-Memory Reinforcement Learning. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#YamaguchiFOS20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/YamaguchiFOS20, added-at = {2020-07-30T00:00:00.000+0200}, author = {Yamaguchi, Marina and Fujii, Shosuke and Ota, Kensuke and Saitoh, Masumi}, biburl = {https://www.bibsonomy.org/bibtex/245fbfb2f58692381ae9470e1bcde9d7a/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9129314}, interhash = {8f6ea9a11288b1980ccbcaa09059fa71}, intrahash = {45fbfb2f58692381ae9470e1bcde9d7a}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2020-07-31T11:52:08.000+0200}, title = {Breakdown Lifetime Analysis of HfO2-based Ferroelectric Tunnel Junction (FTJ) Memory for In-Memory Reinforcement Learning.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#YamaguchiFOS20}, year = 2020 }