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Breakdown Lifetime Analysis of HfO2-based Ferroelectric Tunnel Junction (FTJ) Memory for In-Memory Reinforcement Learning.

, , , и . IRPS, стр. 1-6. IEEE, (2020)

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Fumio Fujii

Fumio Fujii

Fumio Fujii

Tadahiko Fujii

Fumio Fujii

 

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