%0 Conference Paper %1 conf/irps/HigashiBCBARRJBR24 %A Higashi, Yusuke %A Bastos, J. P. %A Chasin, Adrian Vaisman %A Breuil, Laurent %A Arreghini, Antonio %A Ramesh, S. %A Rachidi, S. %A Jeong, Y. %A den Bosch, Geert Van %A Rosmeulen, Maarten %B IRPS %D 2024 %I IEEE %K dblp %P 1-6 %T Investigation of the Impact of Ferroelectricity Boosted Gate Stacks for 3D NAND on Short Time Data Retention and Endurance. %U http://dblp.uni-trier.de/db/conf/irps/irps2024.html#HigashiBCBARRJBR24 %@ 979-8-3503-6976-2

@inproceedings{conf/irps/HigashiBCBARRJBR24, added-at = {2024-05-29T00:00:00.000+0200}, author = {Higashi, Yusuke and Bastos, J. P. and Chasin, Adrian Vaisman and Breuil, Laurent and Arreghini, Antonio and Ramesh, S. and Rachidi, S. and Jeong, Y. and den Bosch, Geert Van and Rosmeulen, Maarten}, biburl = {https://www.bibsonomy.org/bibtex/2f85ac998d75a85d262b14309d62afc63/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2024}, ee = {https://doi.org/10.1109/IRPS48228.2024.10529409}, interhash = {a36a3a18f667d555772d77eb689f9f0a}, intrahash = {f85ac998d75a85d262b14309d62afc63}, isbn = {979-8-3503-6976-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-06-03T07:16:33.000+0200}, title = {Investigation of the Impact of Ferroelectricity Boosted Gate Stacks for 3D NAND on Short Time Data Retention and Endurance.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2024.html#HigashiBCBARRJBR24}, year = 2024 }