%0 Conference Paper %1 conf/irps/ZagniCPPMMZV20 %A Zagni, Nicolò %A Chini, Alessandro %A Puglisi, Francesco Maria %A Pavan, Paolo %A Meneghini, Matteo %A Meneghesso, Gaudenzio %A Zanoni, Enrico %A Verzellesi, Giovanni %B IRPS %D 2020 %I IEEE %K dblp %P 1-5 %T Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#ZagniCPPMMZV20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/ZagniCPPMMZV20, added-at = {2024-05-07T00:00:00.000+0200}, author = {Zagni, Nicolò and Chini, Alessandro and Puglisi, Francesco Maria and Pavan, Paolo and Meneghini, Matteo and Meneghesso, Gaudenzio and Zanoni, Enrico and Verzellesi, Giovanni}, biburl = {https://www.bibsonomy.org/bibtex/2b6d75a80109ac9a7c9d92081a1a2c29f/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9128816}, interhash = {f0fb835ef0d5d5cd483dc8e0d19bf812}, intrahash = {b6d75a80109ac9a7c9d92081a1a2c29f}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-05-13T09:41:10.000+0200}, title = {Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#ZagniCPPMMZV20}, year = 2020 }