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Disambiguation of "Zagni, Nicolò"

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Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs.

, , , , , , , and . IRPS, page 1-5. IEEE, (2020)

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Nicolò Navarin

Kerstin De Nicolò

Christopher De Nicolò

Nicoló Fusi

Nicolo Rivetti

 

Other publications of authors with the same name

Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications., , and . IRPS, page 11. IEEE, (2022)A Novel Temperature Estimation Technique Exploiting Carrier Emission from Buffer Traps., , and . ESSDERC, page 372-375. IEEE, (2022)Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges., , , and . Proc. IEEE, 111 (2): 158-184 (February 2023)A Paradox in ML Design: Less data for a smarter water metering cognification experience., , , , and . GOODTECHS, page 201-206. ACM, (2019)Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs., , , , , , , and . IRPS, page 1-5. IEEE, (2020)Deep Water: Predicting Water Meter Failures Through a Human-Machine Intelligence Collaboration., , , , and . IHIET, volume 1018 of Advances in Intelligent Systems and Computing, page 688-694. Springer, (2019)A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design., , , and . ESSDERC, page 204-207. IEEE, (2017)Energy-Efficient Logic-in-Memory I-bit Full Adder Enabled by a Physics-Based RRAM Compact Model., , , and . ESSDERC, page 50-53. IEEE, (2018)Variability and sensitivity to process parameters variations in InGaAs dual-gate ultra-thin body MOSFETs: A scaling perspective., , , and . PATMOS, page 1-5. IEEE, (2017)