%0 Conference Paper %1 conf/ets/FonsecaDBGPVB10a %A Fonseca, Renan Alves %A Dilillo, Luigi %A Bosio, Alberto %A Girard, Patrick %A Pravossoudovitch, Serge %A Virazel, Arnaud %A Badereddine, Nabil %B European Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 257 %T Setting test conditions for improving SRAM reliability. %U http://dblp.uni-trier.de/db/conf/ets/ets2010.html#FonsecaDBGPVB10a %@ 978-1-4244-5833-2

@inproceedings{conf/ets/FonsecaDBGPVB10a, added-at = {2017-05-22T00:00:00.000+0200}, author = {Fonseca, Renan Alves and Dilillo, Luigi and Bosio, Alberto and Girard, Patrick and Pravossoudovitch, Serge and Virazel, Arnaud and Badereddine, Nabil}, biburl = {https://www.bibsonomy.org/bibtex/2597b92a6c3d629057a2dddf239d6680b/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2010}, ee = {https://doi.org/10.1109/ETSYM.2010.5512734}, interhash = {fd2dcdec9f50f4dfee832a601baf84b6}, intrahash = {597b92a6c3d629057a2dddf239d6680b}, isbn = {978-1-4244-5833-2}, keywords = {dblp}, pages = 257, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T15:59:35.000+0200}, title = {Setting test conditions for improving SRAM reliability.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2010.html#FonsecaDBGPVB10a}, year = 2010 }