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Disambiguation of "Girard, Patrick"

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Setting test conditions for improving SRAM reliability.

, , , , , , and . European Test Symposium, page 257. IEEE Computer Society, (2010)

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Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

 

Other publications of authors with the same name

Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity., , , , , , , and . ISCAS (1), page 110-113. IEEE, (1999)Effect-cause intra-cell diagnosis at transistor level., , , , , , and . ISQED, page 460-467. IEEE, (2013)Energy Model based Control for Forming Processes., and . ICINCO-ICSO, page 51-59. INSTICC Press, (2008)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing., , , , , and . VLSI-SoC, page 403-408. IEEE, (2006)From onions to broccoli: generalizing Lewis' counterfactual logic.. J. Appl. Non Class. Logics, 17 (2): 213-229 (2007)Towards approximation during test of Integrated Circuits., , , , , and . DDECS, page 28-33. IEEE, (2017)Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*., , , , , , , , , and 2 other author(s). ETS, page 1-10. IEEE, (2021)Towards a Model-Based Approach to Support Physical Test Process of Aircraft Hydraulic Systems., , , , , and . MEDI, volume 12732 of Lecture Notes in Computer Science, page 33-40. Springer, (2021)Fast Bridging Fault Diagnosis using Logic Information., , , , , and . ATS, page 33-38. IEEE, (2007)Power-Aware Test Data Compression for Embedded IP Cores., , , , , and . ATS, page 5-10. IEEE, (2006)