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Effect-cause intra-cell diagnosis at transistor level., , , , , , and . ISQED, page 460-467. IEEE, (2013)A Logic Cell Design and routing Methodology Specific to VNWFET., , , , , , , and . NEWCAS, page 460-464. IEEE, (2022)Assertion-aware approximate computing design exploration on behavioral models., , , , , and . LATS, page 1-6. IEEE, (2022)Testing approximate digital circuits: Challenges and opportunities., , , , and . LATS, page 1-6. IEEE, (2018)Reliability of computing systems: From flip flops to variables., , , , and . IOLTS, page 196-198. IEEE, (2017)Towards approximation during test of Integrated Circuits., , , , , and . DDECS, page 28-33. IEEE, (2017)Synthesis of Finite State Machines on Memristor Crossbars., , , , , and . DDECS, page 107-112. IEEE, (2018)Computing reliability: On the differences between software testing and software fault injection techniques., , , , , and . Microprocess. Microsystems, (2017)Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*., , , , , , , , , and 2 other author(s). ETS, page 1-10. IEEE, (2021)Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator., , , , , and . DDECS, page 181-186. IEEE, (2023)