%0 Journal Article %1 journals/mr/HaendlerJGB01 %A Haendler, Sébastien %A Jomaah, Jalal %A Ghibaudo, Gérard %A Balestra, Francis %D 2001 %J Microelectron. Reliab. %K dblp %N 6 %P 855-860 %T Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#HaendlerJGB01 %V 41

@article{journals/mr/HaendlerJGB01, added-at = {2020-02-22T00:00:00.000+0100}, author = {Haendler, Sébastien and Jomaah, Jalal and Ghibaudo, Gérard and Balestra, Francis}, biburl = {https://www.bibsonomy.org/bibtex/2d932531200b2ad8af48b57bff94d6b52/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00021-X}, interhash = {cd7ae961e10097abef93dadbcc9cf53b}, intrahash = {d932531200b2ad8af48b57bff94d6b52}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 6, pages = {855-860}, timestamp = {2020-02-25T13:25:37.000+0100}, title = {Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#HaendlerJGB01}, volume = 41, year = 2001 }