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%0 Conference Paper
%1 conf/irps/ZagniCPPMMZV20
%A Zagni, Nicolò
%A Chini, Alessandro
%A Puglisi, Francesco Maria
%A Pavan, Paolo
%A Meneghini, Matteo
%A Meneghesso, Gaudenzio
%A Zanoni, Enrico
%A Verzellesi, Giovanni
%B IRPS
%D 2020
%I IEEE
%K dblp
%P 1-5
%T Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs.
%U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#ZagniCPPMMZV20
%@ 978-1-7281-3199-3
@inproceedings{conf/irps/ZagniCPPMMZV20,
added-at = {2024-05-07T00:00:00.000+0200},
author = {Zagni, Nicolò and Chini, Alessandro and Puglisi, Francesco Maria and Pavan, Paolo and Meneghini, Matteo and Meneghesso, Gaudenzio and Zanoni, Enrico and Verzellesi, Giovanni},
biburl = {https://www.bibsonomy.org/bibtex/2b6d75a80109ac9a7c9d92081a1a2c29f/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2020},
ee = {https://doi.org/10.1109/IRPS45951.2020.9128816},
interhash = {f0fb835ef0d5d5cd483dc8e0d19bf812},
intrahash = {b6d75a80109ac9a7c9d92081a1a2c29f},
isbn = {978-1-7281-3199-3},
keywords = {dblp},
pages = {1-5},
publisher = {IEEE},
timestamp = {2024-05-13T09:41:10.000+0200},
title = {Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#ZagniCPPMMZV20},
year = 2020
}