%0 Conference Paper %1 conf/ets/AngioneBFRATU22 %A Angione, Francesco %A Bernardi, Paolo %A Filipponi, Gabriele %A Reorda, Matteo Sonza %A Appello, Davide %A Tancorre, Vincenzo %A Ugioli, Roberto %B ETS %D 2022 %I IEEE %K dblp %P 1-6 %T An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. %U http://dblp.uni-trier.de/db/conf/ets/ets2022.html#AngioneBFRATU22 %@ 978-1-6654-6706-3

@inproceedings{conf/ets/AngioneBFRATU22, added-at = {2023-09-30T00:00:00.000+0200}, author = {Angione, Francesco and Bernardi, Paolo and Filipponi, Gabriele and Reorda, Matteo Sonza and Appello, Davide and Tancorre, Vincenzo and Ugioli, Roberto}, biburl = {https://www.bibsonomy.org/bibtex/22d9ac3838462915322955c9d28bd3627/dblp}, booktitle = {ETS}, crossref = {conf/ets/2022}, ee = {https://doi.org/10.1109/ETS54262.2022.9810396}, interhash = {f5bfcd0e2947d42aa18063654860cb8d}, intrahash = {2d9ac3838462915322955c9d28bd3627}, isbn = {978-1-6654-6706-3}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T13:19:37.000+0200}, title = {An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2022.html#AngioneBFRATU22}, year = 2022 }