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Disambiguation of "Bhawmik, Sudipta"

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Efficient test-point selection for scan-based BIST.

, , , and . IEEE Trans. Very Large Scale Integr. Syst., 6 (4): 667-676 (1998)

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Sudipta Majumdar

Sudipta Das

Sudipta Sengupta

Sudipta Kundu

Sudipta Basu

 

Other publications of authors with the same name

Reformatting Test Patterns for Testing Embedded Core Based System Using Test Access Mechanism (TAM) Switch., , , , and . ASP-DAC/VLSI Design, page 598-603. IEEE Computer Society, (2002)The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data., , , , , and . ITC, page 998-1007. IEEE Computer Society, (2003)Integration of partial scan and built-in self-test., , and . J. Electron. Test., 7 (1-2): 125-137 (1995)DFTEXPERT: An Expert System for Design of Testable VLSI Circuits., and . IEA/AIE (Vol. 1), page 388-396. ACM, (1988)Enhanced Controllability for IDDQ Test Sets Using Partial Scan., , , and . DAC, page 278-281. ACM, (1991)An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch., , , and . J. Electron. Test., 18 (4-5): 475-485 (2002)Core Based ASIC Design., and . VLSI Design, page 10. IEEE Computer Society, (2000)Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme., , and . DAC, page 748-753. ACM Press, (1999)A Hybrid Algorithm for Test Point Selection for Scan-Based BIST., , , and . DAC, page 478-483. ACM Press, (1997)Efficient test-point selection for scan-based BIST., , , and . IEEE Trans. Very Large Scale Integr. Syst., 6 (4): 667-676 (1998)