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The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data.

, , , , , and . ITC, page 998-1007. IEEE Computer Society, (2003)

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Variation Aware Analysis of Bridging Fault Testing., , and . ATS, page 206-211. IEEE Computer Society, (2008)The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data., , , , , and . ITC, page 998-1007. IEEE Computer Society, (2003)Gate-Sizing-Based Single Vdd Test for Bridge Defects in Multivoltage Designs., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 29 (9): 1409-1421 (2010)Addressing Functional Safety Challenges in Autonomous Vehicles with the Arm TCL S Architecture., , , , , , and . IEEE Des. Test, 35 (3): 7-14 (2018)Testing reusable IP-a case study.. ITC, page 493-498. IEEE Computer Society, (1999)Error Correlation Prediction in Lockstep Processors for Safety-Critical Systems., , , , , , , and . MICRO, page 737-748. IEEE Computer Society, (2018)Bridge Defect Diagnosis for Multiple-Voltage Design., , , , and . ETS, page 99-104. IEEE Computer Society, (2008)Boundary-scan design for cost-sensitive applications.. Microprocess. Microsystems, 17 (5): 277-280 (1993)Dynamic Voltage Scaling Aware Delay Fault Testing., , , and . ETS, page 15-20. IEEE Computer Society, (2006)Test in the Emerging Intellectual Property Business., and . IEEE Des. Test Comput., 16 (1): 16-18 (1999)