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Adding a self-reset feature to the Bulk-BICS with dynamic storage cell., и . Microelectron. Reliab., 55 (12): 2748-2753 (2015)Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants., , , , , и . Microelectron. Reliab., 52 (12): 2955-2961 (2012)Single event transients in combinatorial circuits., , , и . SBCCI, стр. 121-126. ACM, (2005)Statistical and Numerical Approach for a Computer efficient circuit yield analysis., , , и . VLSI-SoC (Selected Papers), том 291 из IFIP, стр. 1-24. Springer, (2007)Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors., , , , , и . LATS, стр. 1-6. IEEE, (2018)Generation and Propagation of Single Event Transients in CMOS Circuits., , , и . DDECS, стр. 198-203. IEEE Computer Society, (2006)An experimental 0.6-V 57.5-fJ/conversion-step 250-kS/s 8-bit rail-to-rail successive approximation ADC in 0.18µm CMOS., , , и . ICECS, стр. 195-198. IEEE, (2009)Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability., , , , и . ICECS, стр. 137-140. IEEE, (2015)Novel analytical and numerical approach to modeling low-frequency noise in semiconductor devices, , и . Physica A: Statistical Mechanics and its Applications, 362 (2): 277--288 (01.04.2006)Using Bulk Built-in Current Sensors to Detect Soft Errors., , , , и . IEEE Micro, 26 (5): 10-18 (2006)