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Statistical and Numerical Approach for a Computer efficient circuit yield analysis.

, , , and . VLSI-SoC (Selected Papers), volume 291 of IFIP, page 1-24. Springer, (2007)

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Single event transients in combinatorial circuits., , , and . SBCCI, page 121-126. ACM, (2005)Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants., , , , , and . Microelectron. Reliab., 52 (12): 2955-2961 (2012)Generation and Propagation of Single Event Transients in CMOS Circuits., , , and . DDECS, page 198-203. IEEE Computer Society, (2006)An experimental 0.6-V 57.5-fJ/conversion-step 250-kS/s 8-bit rail-to-rail successive approximation ADC in 0.18µm CMOS., , , and . ICECS, page 195-198. IEEE, (2009)Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability., , , , and . ICECS, page 137-140. IEEE, (2015)Statistical and Numerical Approach for a Computer efficient circuit yield analysis., , , and . VLSI-SoC (Selected Papers), volume 291 of IFIP, page 1-24. Springer, (2007)Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors., , , , , and . LATS, page 1-6. IEEE, (2018)Técnicas probabilísticas para análise de yield em nível elétrico usando propagação de erros e derivadas numéricas., , , and . RITA, 14 (2): 69-89 (2007)Modeling the impact of RTS on the reliability of ring oscillators., and . SBCCI, page 128-133. ACM, (2010)Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies., , , , , and . VLSI-SoC, page 78-83. IEEE, (2007)