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IC laser trimming speed-up through wafer-level spatial correlation modeling.

, , , , , , и . ITC, стр. 1-7. IEEE Computer Society, (2014)

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Hilal Orr

Dominic Orr

Dominic Orr

Dominic Orr

Jonathan Bob

 

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Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion., , , , , и . ICCAD, стр. 9-14. IEEE, (2015)Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs., , , , и . VTS, стр. 1-6. IEEE Computer Society, (2016)A machine learning approach to fab-of-origin attestation., , , , , и . ICCAD, стр. 92. ACM, (2016)Harnessing process variations for optimizing wafer-level probe-test flow., , , , , и . ITC, стр. 1-8. IEEE, (2016)Yield prognosis for fab-to-fab product migration., , , , , , и . VTS, стр. 1-6. IEEE Computer Society, (2015)Harnessing fabrication process signature for predicting yield across designs., , , , , и . ISCAS, стр. 898-901. IEEE, (2016)Wafer-level adaptive trim seed forecasting based on E-tests., , , , , и . ISCAS, стр. 1-4. IEEE, (2017)IC laser trimming speed-up through wafer-level spatial correlation modeling., , , , , , и . ITC, стр. 1-7. IEEE Computer Society, (2014)Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations., , , , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (12): 2120-2133 (2017)