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Panel Session - Vertical integration versus disaggregation.. DATE, page 602. IEEE, (2009)International Test Conference in Asia (ITC-Asia) - Bridging ITC and Test Community in Asia., , , , and . ITC, page 1-4. IEEE, (2019)Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs., , , , and . ITC, page 1-6. IEEE, (2018)Memory FIT Rate Mitigation Technique for Automotive SoCs., , , , , , , and . ITC, page 1-6. IEEE, (2019)On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI., , , , and . ETS, page 1-4. IEEE, (2023)Some Experiments in Test Pattern Generation for FPGA-Implemented Combinational Circuits., , , , and . SBCCI, page 3-8. IEEE Computer Society, (2000)Testing Embedded Core-Based System Chips., and . LATW, page 2. IEEE, (2001)Test Configuration Generation for FPGA Logic Cells., , , and . LATW, page 202-208. IEEE, (2000)SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor., , , , and . ITC, page 388-392. IEEE, (2023)Test Pattern and Test Configuration Generation Methodology for the Logic of RAM-Based FPGA., , , and . Asian Test Symposium, page 254-. IEEE Computer Society, (1997)