Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Key parameters driving transistor degradation in advanced strained SiGe channels., , , , , , , and . IRPS, page 4-1. IEEE, (2018)AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment., , , , , and . IRPS, page 4. IEEE, (2018)Modeling self-heating effects in advanced CMOS nodes., , , , , and . IRPS, page 3-1. IEEE, (2018)Integrated Test Structures for Reliability Investigation under Dynamic Stimuli., , , , , and . IOLTS, page 1-5. IEEE, (2018)Frequency dependant gate oxide TDDB model., , , , , , and . IRPS, page 25-1. IEEE, (2022)Comparison of variations in MOSFET versus CNFET in gigascale integrated systems., , and . ISQED, page 378-383. IEEE, (2012)Logic Gate Failure Characterization for Nanoelectronic EDA Tools., and . DFT, page 16-23. IEEE Computer Society, (2010)Fuzzy Logic Based Weight Balancing., , , , , , and . CSOS (2), volume 764 of Advances in Intelligent Systems and Computing, page 354-363. Springer, (2018)Prediction of gate delay variation for CNFET under CNT density variation., and . DFT, page 140-145. IEEE Computer Society, (2012)