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Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.

, , , , , и . VTS, стр. 361-368. IEEE Computer Society, (2007)

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Josef Ney

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Другие публикации лиц с тем же именем

A Design-for-Diagnosis Technique for SRAM Write Drivers., , , , , и . DATE, стр. 1480-1485. ACM, (2008)A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs., , , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2008)An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing., , , , , и . VTS, стр. 89-94. IEEE Computer Society, (2008)A new design-for-test technique for SRAM core-cell stability faults., , , , , , и . DATE, стр. 1344-1348. IEEE, (2009)Slow write driver faults in 65nm SRAM technology: analysis and March test solution., , , , , и . DATE, стр. 528-533. EDA Consortium, San Jose, CA, USA, (2007)Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs., , , , , и . ETS, стр. 97-104. IEEE Computer Society, (2007)Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior., , , , , , и . ATS, стр. 507-510. IEEE, (2007)Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs., , , , , и . VTS, стр. 361-368. IEEE Computer Society, (2007)