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Disambiguation of "Bastian, Magali"

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Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.

, , , , , and . VTS, page 361-368. IEEE Computer Society, (2007)

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Magali Philippsborn

Magali Teurlai

Magali Bardet

Magali Fansa

Magali Saikin

 

Other publications of authors with the same name

Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies., , , , and . DAC, page 857-862. ACM, (2005)Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs., , , , , and . VTS, page 361-368. IEEE Computer Society, (2007)A Design-for-Diagnosis Technique for SRAM Write Drivers., , , , , and . DATE, page 1480-1485. ACM, (2008)Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects., , , and . ISVLSI, page 310-315. IEEE Computer Society, (2008)A Novel Dummy Bitline Driver for Read Margin Improvement in an eSRAM., , , and . DELTA, page 107-110. IEEE Computer Society, (2008)Slow write driver faults in 65nm SRAM technology: analysis and March test solution., , , , , and . DATE, page 528-533. EDA Consortium, San Jose, CA, USA, (2007)A new design-for-test technique for SRAM core-cell stability faults., , , , , , and . DATE, page 1344-1348. IEEE, (2009)Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits., , , , and . J. Electron. Test., 23 (5): 435-444 (2007)Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs., , , , , and . ETS, page 97-104. IEEE Computer Society, (2007)March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit., , , , and . DDECS, page 256-261. IEEE Computer Society, (2006)