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Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.

A. Ney, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, and M. Bastian. VTS, page 361-368. IEEE Computer Society, (2007)

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Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

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Effect-cause intra-cell diagnosis at transistor level.Z. Sun, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and E. Auvray. ISQED, page 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.N. Badereddine, P. Girard, S. Pravossoudovitch, C. Landrault, A. Virazel, and H. Wunderlich. VLSI-SoC, page 403-408. IEEE, (2006)Energy Model based Control for Forming Processes.P. Girard, and V. Thomson. ICINCO-ICSO, page 51-59. INSTICC Press, (2008)Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity.P. Girard, L. Guiller, C. Landrault, S. Pravossoudovitch, J. Figueras, S. Manich, J. Teixeira, and M. Santos. ISCAS (1), page 110-113. IEEE, (1999)Example-based programming: a pertinent visual approach for learning to program.N. Guibert, P. Girard, and L. Guittet. AVI, page 358-361. ACM Press, (2004)Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation.N. Guibert, L. Guittet, and P. Girard. IHM, volume 264 of ACM International Conference Proceeding Series, page 147-154. ACM, (2005)Voltage Bootstrapped Schmitt Trigger based Radiation Hardened Latch Design for Reliable Circuits.N. Gupta, N. Agrawal, N. Dhakad, A. Shah, S. Vishvakarma, and P. Girard. ACM Great Lakes Symposium on VLSI, page 307-312. ACM, (2021)Two 0.8 V, Highly Reliable RHBD 10T and 12T SRAM Cells for Aerospace Applications.A. Yan, Z. He, J. Xiang, J. Cui, Y. Zhou, Z. Huang, P. Girard, and X. Wen. ACM Great Lakes Symposium on VLSI, page 261-266. ACM, (2022)A Highly Robust, Low Delay and DNU-Recovery Latch Design for Nanoscale CMOS Technology.A. Yan, Z. Zhou, S. Wei, J. Cui, Y. Zhou, T. Ni, P. Girard, and X. Wen. ACM Great Lakes Symposium on VLSI, page 255-260. ACM, (2022)A Ring Architecture Strategy for BIST Test Pattern Generation.C. Fagot, O. Gascuel, P. Girard, and C. Landrault. J. Electron. Test., 19 (3): 223-231 (2003)

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Disambiguation of "Girard, Patrick"

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Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.