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Disambiguation of "Garros, Xavier"

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Parasitic Capacitance Analysis in Short Channel GaN MIS-HEMTs.

, , , , , , , , , , , and . ESSDERC, page 299-302. IEEE, (2021)

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Xavier Domont

Xavier Lambin

Xavier Fontaine

Arumainathan Xavier

Xavier Leroy

 

Other publications of authors with the same name

Impact of spacer interface charges on performance and reliability of low temperature transistors for 3D sequential integration., , , , , , , , , and 2 other author(s). IRPS, page 1-5. IEEE, (2021)Frequency dependant gate oxide TDDB model., , , , , , and . IRPS, page 25-1. IEEE, (2022)Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications., and . Microelectron. Reliab., 41 (9-10): 1307-1312 (2001)Parasitic Capacitance Analysis in Short Channel GaN MIS-HEMTs., , , , , , , , , and 2 other author(s). ESSDERC, page 299-302. IEEE, (2021)Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology., , , , , , and . IRPS, page 1-5. IEEE, (2019)First Radio-Frequency Circuits Fabricated in Top-Tier of a Full 3D Sequential Integration Process at mmW for 5G Applications., , , , , , , , , and 4 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2024)Breakthrough Processes for Si CMOS Devices with BEOL Compatibility for 3D Sequential Integrated more than Moore Analog Applications., , , , , , , , , and 24 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2024)BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations., , , , , , , and . IRPS, page 1-5. IEEE, (2021)Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications., , , , , , , and . IRPS, page 4. IEEE, (2022)CMOS VT characterization by capacitance measurements in FDSOI PIN gated diodes., , , , , and . ESSDERC, page 405-408. IEEE, (2014)