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An Efficient Dictionary Organization for Maximum Diagnosis.

, , , и . J. Electron. Test., 22 (1): 37-48 (2006)

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Dai-Hai Chung

Hae-Bon Chung

Chong-Woon Chung

Myeong-Kee Chung

Ki-Nam Chung

 

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A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method., , , , , , , , , и 2 other автор(ы). ITC, стр. 1-10. IEEE Computer Society, (2008)An Efficient Dictionary Organization for Maximum Diagnosis., , , и . J. Electron. Test., 22 (1): 37-48 (2006)RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test., , , , и . Asian Test Symposium, стр. 242-247. IEEE Computer Society, (2004)MICRO: a new hybrid test data compression/decompression scheme., , , и . IEEE Trans. Very Large Scale Integr. Syst., 14 (6): 649-654 (2006)XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults., , , , и . ATS, стр. 83-88. IEEE Computer Society, (2008)A new low energy BIST using a statistical code., , и . ASP-DAC, стр. 647-652. IEEE, (2008)MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs., , и . J. Electron. Test., 23 (4): 357-362 (2007)A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections., , , и . VTS, стр. 152-157. IEEE Computer Society, (2009)A New Maximal Diagnosis Algorithm for Bus-structured Systems., , , , и . ITC, стр. 349-357. IEEE Computer Society, (2003)An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation., , , и . VTS, стр. 73-78. IEEE Computer Society, (2008)