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Theoretical Investigation of an Equivalent Laser LET., , , , и . Microelectron. Reliab., 41 (9-10): 1513-1518 (2001)Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization., , , , и . Microelectron. Reliab., 51 (9-11): 1684-1688 (2011)Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser., , и . LATW, стр. 109-113. IEEE, (2002)Application of various optical techniques for ESD defect localization., , , , , , , , , и . Microelectron. Reliab., 46 (9-11): 1563-1568 (2006)Identification of process/design issues during 0.18 µm technology qualification for space application., , , и . DATE, стр. 989-993. EDA Consortium, San Jose, CA, USA, (2007)Impact of semiconductors material on IR Laser Stimulation signal., , , , , и . Microelectron. Reliab., 45 (9-11): 1465-1470 (2005)Effects of 1064 nm laser on MOS capacitor., , , , , , и . Microelectron. Reliab., 52 (9-10): 1816-1821 (2012)Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation., , , , , и . Microelectron. Reliab., 46 (9-11): 1514-1519 (2006)Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis., , , , , и . Microelectron. Reliab., 51 (9-11): 1640-1645 (2011)Understanding the effects of NIR laser stimulation on NMOS transistor., , , , , и . Microelectron. Reliab., 44 (9-11): 1675-1680 (2004)