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A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits.

, , , , и . IEICE Trans. Inf. Syst., 91-D (3): 667-674 (2008)

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Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

 

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