Author of the publication

Modeling and Analysis of Parametric Yield under Power and Performance Constraints.

, , , and . IEEE Des. Test Comput., 22 (4): 376-385 (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Statistical estimation of leakage current considering inter- and intra-die process variation., , , and . ISLPED, page 84-89. ACM, (2003)Circuit optimization techniques to mitigate the effects of soft errors in combinational logic., , , and . ACM Trans. Design Autom. Electr. Syst., 15 (1): 5:1-5:27 (2009)Bus encoding for total power reduction using a leakage-aware buffer configuration., , , and . IEEE Trans. Very Large Scale Integr. Syst., 13 (12): 1376-1383 (2005)Modeling and Analysis of Parametric Yield under Power and Performance Constraints., , , and . IEEE Des. Test Comput., 22 (4): 376-385 (2005)IBM POWER7+ design for higher frequency at fixed power., , , , , , , , and . IBM J. Res. Dev., (2013)Soft error reduction in combinational logic using gate resizing and flipflop selection., , and . ICCAD, page 502-509. ACM, (2006)Leakage-and crosstalk-aware bus encoding for total power reduction., , , and . DAC, page 779-782. ACM, (2004)Computing the Soft Error Rate of a Combinational Logic Circuit Using Parameterized Descriptors., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 26 (3): 468-479 (2007)An efficient static algorithm for computing the soft error rates of combinational circuits., , , and . DATE, page 164-169. European Design and Automation Association, Leuven, Belgium, (2006)Analytical yield prediction considering leakage/performance correlation., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (9): 1685-1695 (2006)