( en | de | ru )

 

Disambiguation of "Leung, Jenny"

Author of the publication

copydeleteadd this publication to your clipboard
Tradeoffs in imager design parameters for sensor reliability.

, , , , and . Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications, volume 7875 of SPIE Proceedings, page 78750I. SPIE, (2011)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Raymond Leung

Po Leung

Ernst Gabriel Jenny

Tabea S Jenny

Reto M Jenny

 

Other publications of authors with the same name

Statistical identification and analysis of defect development in digital imagers., , , and . Digital Photography, volume 7250 of SPIE Proceedings, page 72500. SPIE, (2009)A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects., , , and . DFT, page 517-525. IEEE Computer Society, (2007)Tradeoffs in imager design parameters for sensor reliability., , , , and . Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications, volume 7875 of SPIE Proceedings, page 78750I. SPIE, (2011)Workload Evaluations for Closed Captioners., , , , , , and . ICCHP-AAATE (1), volume 13341 of Lecture Notes in Computer Science, page 529-535. Springer, (2022)Predicting Pixel Defect Rates Based on Image Sensor Parameters., , , , and . DFT, page 408-416. IEEE Computer Society, (2011)Tradeoffs in Imager Design with Respect to Pixel Defect Rates., , , and . DFT, page 231-239. IEEE Computer Society, (2010)Characterization of Gain Enhanced In-Field Defects in Digital Imagers., , , and . DFT, page 155-163. IEEE Computer Society, (2009)Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO., , , , , and . Sensors, Cameras, and Systems for Industrial and Scientific Applications, volume 8298 of SPIE Proceedings, page 82980E. SPIE, (2012)Quantitative Analysis of In-Field Defects in Image Sensor Arrays., , , , and . DFT, page 526-534. IEEE Computer Society, (2007)Automatic Detection of In-field eld Defect Growth in Image Sensors., , , and . DFT, page 305-313. IEEE Computer Society, (2008)