Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images.

B. Dey, V. Ridder, V. Blanco, S. Halder, and B. Waeyenberge. CoRR, (2024)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Sandip Halder

Sandip Agarwala

Sandip Murarka

Sandip Roy

Sandip Pal

Other publications of authors with the same name

A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection.E. Dehaerne, B. Dey, and S. Halder. ICECS 2022, page 1-2. IEEE, (2022)Using Unsupervised Machine Learning for Plasma Etching Endpoint Detection.I. Chakroun, T. Ashby, S. Das, S. Halder, R. Wuyts, and W. Verachtert. ICPRAM, page 273-279. SCITEPRESS, (2020)Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy.V. Ridder, B. Dey, V. Blanco, S. Halder, and B. Waeyenberge. CoRR, (2023)SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering.M. Hwang, B. Dey, E. Dehaerne, S. Halder, and Y. han Shin. CoRR, (2023)Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images.B. Dey, V. Ridder, V. Blanco, S. Halder, and B. Waeyenberge. CoRR, (2024)Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization.E. Dehaerne, B. Dey, S. Halder, and S. Gendt. CoRR, (2023)Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE.S. Sacchi, B. Dey, I. Mochi, S. Halder, and P. Leray. CoRR, (2023)Optimizing YOLOv7 for Semiconductor Defect Detection.E. Dehaerne, B. Dey, S. Halder, and S. Gendt. CoRR, (2023)In-line metrology and inspection for process control during 3D stacking of IC's.S. Halder, I. Wolf, A. Phommahaxay, A. Miller, M. Maenhoudt, G. Beyer, B. Swinnen, and E. Beyne. 3DIC, page 1-4. IEEE, (2011)An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection.A. Prasad, B. Dey, V. Blanco, and S. Halder. CoRR, (2024)

BibSonomy

Disambiguation of "Halder, Sandip"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images.

Please choose a person to relate this publication to

Sandip Halder

Sandip Agarwala

Sandip Murarka

Sandip Roy

Sandip Pal

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Halder, Sandip"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images.

Please choose a person to relate this publication to

Sandip Halder

Sandip Agarwala

Sandip Murarka

Sandip Roy

Sandip Pal

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images.