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Microwave Engineering: Concepts and Fundamentals, Ahmad Shahid Khan. CRC Press Taylor & Francis Group, Boca Raton (2014). 800 p., Hardcover, ISBN: 9781466591417.. Microelectron. Reliab., 55 (2): 461 (2015)NBTI and irradiation related degradation mechanisms in power VDMOS transistors., , , , , , , , and . Microelectron. Reliab., (2018)NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs., , , , , and . Microelectron. Reliab., 46 (9-11): 1828-1833 (2006)A review of pulsed NBTI in P-channel power VDMOSFETs., , , , , , , , , and . Microelectron. Reliab., (2018)NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions., , , , , , , and . Microelectron. Reliab., 51 (9-11): 1540-1543 (2011)Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress., , , , , , , , , and 4 other author(s). J. Circuits Syst. Comput., 31 (18): 2240003:1-2240003:25 (December 2022)Negative bias temperature instability in n-channel power VDMOSFETs., , , , , and . Microelectron. Reliab., 48 (8-9): 1313-1317 (2008)Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs., , , , , and . Microelectron. Reliab., 47 (9-11): 1400-1405 (2007)