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Disambiguation of "Wen, Shi-Jie"

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Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.

, , , , , , , , and . J. Electron. Test., 29 (4): 609-616 (2013)

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Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Ding

Jie Huang

 

Other publications of authors with the same name

Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS., , , , , , and . CICC, page 1-4. IEEE, (2011)Placement of repair circuits for in-field FPGA repair., , , , , and . FPGA, page 115-124. ACM, (2013)IZIP: In-place zero overhead interconnect protection via PIP redundancy., , , , and . ASICON, page 565-568. IEEE, (2017)Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node., , , , , and . IOLTS, page 253-257. IEEE Computer Society, (2008)A Systematical Method of Quantifying SEU FIT., , and . IOLTS, page 109-114. IEEE Computer Society, (2008)RIIF - Reliability information interchange format., , , , and . IOLTS, page 103-108. IEEE Computer Society, (2012)Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology., , , , , , and . IRPS, page 1-5. IEEE, (2020)Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment., , , , , , , , , and 1 other author(s). IRPS, page 7. IEEE, (2022)Traffic Anomaly Detection Via Conditional Normalizing Flow., , , , and . ITSC, page 2563-2570. IEEE, (2022)Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems., , , , , , , , , and 1 other author(s). IRPS, page 1-7. IEEE, (2024)