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Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.

C. Tsai, K. Lee, C. Lin, S. Yu, W. Liau, A. Hou, Y. Chen, C. Kuo, J. Lee, and M. Chao. VTS, page 1-6. IEEE Computer Society, (2016)

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Ying Chen

Other publications of authors with the same name

A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement.C. Lin, C. Tsai, K. Lee, S. Yu, W. Liau, A. Hou, Y. Chen, C. Kuo, J. Lee, and M. Chao. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (10): 2139-2151 (2018)Improving Cell-Aware Test for Intra-Cell Short Defects.D. Lee, Y. Chen, K. Wu, and M. Chao. DATE, page 436-441. IEEE, (2022)Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques.T. Huang, W. Hung, H. Yang, W. Chang, Y. Chen, C. Kuo, J. Lee, and M. Chao. ASP-DAC, page 426-431. IEEE, (2017)Methodology of Generating Timing-Slack-Based Cell-Aware Tests.Y. Nien, K. Wu, D. Lee, Y. Chen, P. Chen, M. Chern, J. Lee, S. Kao, and M. Chao. ITC, page 1-10. IEEE, (2019)Methodology of Generating Timing-Slack-Based Cell-Aware Tests.Y. Nien, K. Wu, D. Lee, Y. Chen, P. Chen, M. Chern, J. Lee, S. Kao, and M. Chao. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (11): 5057-5070 (2022)Fuzzy Flexible Delivery and Pickup Problem with Time Windows.Y. Chen. ITQM, volume 17 of Procedia Computer Science, page 379-386. Elsevier, (2013)Diagnosis framework for locating failed segments of path delay faults.Y. Chen, M. Kuo, and J. Liou. ITC, page 8. IEEE Computer Society, (2005)Methodology of generating dual-cell-aware tests.Y. Huang, C. Lu, T. Wu, Y. Nien, Y. Chen, M. Wu, J. Lee, and M. Chao. VTS, page 1-6. IEEE Computer Society, (2017)A prototype of a wireless-based test system.J. Liou, C. Huang, C. Wu, C. Tien, C. Wang, H. Ma, Y. Chen, Y. Hsu, L. Denq, C. Chiu and 2 other author(s). SoCC, page 225-228. IEEE, (2007)Automatic Test Wrapper Synthesis for a Wireless ATE Platform.C. Yang, Y. Chen, S. Chen, and J. Liou. IEEE Des. Test Comput., 27 (3): 31-41 (2010)

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Disambiguation of "Chen, Ying-Yen"

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Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.

Please choose a person to relate this publication to

Ying Chen

Ying Chen

Ying Chen

Ying Chen

Ying Chen

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Chen, Ying-Yen"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.

Please choose a person to relate this publication to

Ying Chen

Ying Chen

Ying Chen

Ying Chen

Ying Chen

Other publications of authors with the same name

Disambiguation

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URL
DOI
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Chicago
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Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.