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A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement.

C. Lin, C. Tsai, K. Lee, S. Yu, W. Liau, A. Hou, Y. Chen, C. Kuo, J. Lee, and M. Chao. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (10): 2139-2151 (2018)

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Wolfgang Nungässer

Thilo Nungesser

Ernesto Nungesser

Wilhelm Nungesser

Verena-Susanna Nungesser

Other publications of authors with the same name

Methodology of Generating Timing-Slack-Based Cell-Aware Tests.Y. Nien, K. Wu, D. Lee, Y. Chen, P. Chen, M. Chern, J. Lee, S. Kao, and M. Chao. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (11): 5057-5070 (2022)Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques.T. Huang, W. Hung, H. Yang, W. Chang, Y. Chen, C. Kuo, J. Lee, and M. Chao. ASP-DAC, page 426-431. IEEE, (2017)Methodology of Generating Timing-Slack-Based Cell-Aware Tests.Y. Nien, K. Wu, D. Lee, Y. Chen, P. Chen, M. Chern, J. Lee, S. Kao, and M. Chao. ITC, page 1-10. IEEE, (2019)Methodology of generating dual-cell-aware tests.Y. Huang, C. Lu, T. Wu, Y. Nien, Y. Chen, M. Wu, J. Lee, and M. Chao. VTS, page 1-6. IEEE Computer Society, (2017)Fault Pattern Oriented Defect Diagnosis for Memories.C. Wang, K. Cheng, J. Lee, Y. Chou, C. Huang, C. Wu, F. Huang, and H. Yang. ITC, page 29-38. IEEE Computer Society, (2003)FAME: A Fault-Pattern Based Memory Failure Analysis Framework.K. Cheng, C. Wang, J. Lee, Y. Chou, C. Huang, and C. Wu. ICCAD, page 595-598. IEEE Computer Society / ACM, (2003)CNN-based Stochastic Regression for IDDQ Outlier Identification.C. Chen, C. Yen, C. Wen, C. Yang, K. Wu, M. Chern, Y. Chen, C. Kuo, J. Lee, S. Kao and 1 other author(s). VTS, page 1-6. IEEE, (2020)Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.C. Tsai, K. Lee, C. Lin, S. Yu, W. Liau, A. Hou, Y. Chen, C. Kuo, J. Lee, and M. Chao. VTS, page 1-6. IEEE Computer Society, (2016)Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks.C. Yang, C. Yen, T. Wang, C. Chen, M. Chern, Y. Chen, J. Lee, S. Kao, K. Wu, and M. Chao. VTS, page 1-7. IEEE, (2021)Layout-Based Dual-Cell-Aware Tests.T. Wu, D. Lee, Y. Huang, M. Chao, K. Wu, S. Kao, Y. Chen, P. Chen, M. Chern, and J. Lee. VTS, page 1-6. IEEE, (2019)

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Disambiguation of "Lee, Jih-Nung"

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A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement.

Please choose a person to relate this publication to

Wolfgang Nungässer

Thilo Nungesser

Ernesto Nungesser

Wilhelm Nungesser

Verena-Susanna Nungesser

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Lee, Jih-Nung"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement.

Please choose a person to relate this publication to

Wolfgang Nungässer

Thilo Nungesser

Ernesto Nungesser

Wilhelm Nungesser

Verena-Susanna Nungesser

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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MSOffice XML

A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement.