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Disambiguation of "Kuo, Chun-Yi"

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A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement.

, , , , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (10): 2139-2151 (2018)

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Chun-Nan Kuo

Fang-Chun Kuo

Kuo-Yi Lim

Yi-Chun Yen

Yi Chun Shi

 

Other publications of authors with the same name

Using Rough Set Theory and Decision Trees to Diagnose Enterprise Distress - Consideration of Corporate Governance Variables., , and . ICIC (2), volume 8589 of Lecture Notes in Computer Science, page 199-211. Springer, (2014)A Novel Procedure to Identify the Minimized Overlap Boundary of Two Groups by DEA Model., and . ICCSA (4), volume 3483 of Lecture Notes in Computer Science, page 577-586. Springer, (2005)A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement., , , , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (10): 2139-2151 (2018)Quantitative Assessment of Diabetics with Various Degrees of Autonomic Neuropathy., , and . BIOSIGNALS, page 302-305. SciTePress, (2013)Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (3): 667-674 (2014)Employing a Voice-Based Emotion-Recognition Function in a Social Chatbot to Foster Social and Emotional Learning Among Preschoolers., , , , , , and . HCI (LBP), volume 11786 of Lecture Notes in Computer Science, page 341-356. Springer, (2019)CNN-based Stochastic Regression for IDDQ Outlier Identification., , , , , , , , , and 1 other author(s). VTS, page 1-6. IEEE, (2020)Predicting Vt mean and variance from parallel Id measurement with model-fitting technique., , , , , , , , , and . VTS, page 1-6. IEEE Computer Society, (2016)Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques., , , , , , , and . ASP-DAC, page 426-431. IEEE, (2017)The research on uncertainty and information searching in service firms., , and . SOLI, page 257-262. IEEE, (2012)