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Disambiguation of "Shluger, Alexander L."

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Combining measurements and modeling/simulations analysis to assess carbon nanotube memory cell characteristics.

, , , , , , , , , , , and . IRPS, page 36-1. IEEE, (2022)

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Alexander L Vogel

Alexander F L Nill

L Bräuer

L Solymosi

L Müller

 

Other publications of authors with the same name

Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents., , , , , , , and . IMW, page 1-4. IEEE, (2022)Mitigating switching variability in carbon nanotube memristors., , , , , , , , , and 3 other author(s). IRPS, page 1-4. IEEE, (2021)Efficient parametrization of complex molecule-surface force fields., , , and . J. Comput. Chem., 36 (16): 1187-1195 (2015)On the volatility of oxide defects: Activation, deactivation, and transformation., , , , , , and . IRPS, page 5. IEEE, (2015)Towards a Universal Model of Dielectric Breakdown., , , , , and . IRPS, page 1-8. IEEE, (2023)Hydrogen Induced Dipole Layer in Pd-SiO2 Based Gas Sensors., , , , , and . SAS, page 1-6. IEEE, (2022)Combining measurements and modeling/simulations analysis to assess carbon nanotube memory cell characteristics., , , , , , , , , and 2 other author(s). IRPS, page 36-1. IEEE, (2022)Theories of scanning probe microscopes at the atomic scale, , and . Rev. Mod. Phys., 75 (4): 1287--1331 (October 2003)Variability sources and reliability of 3D - FeFETs., , , , , , , , , and 3 other author(s). IRPS, page 1-7. IEEE, (2021)Defining the performance of SiOx ReRAM by engineering oxide microstructure., , , , , , , , , and . MOCAST, page 1-4. IEEE, (2022)