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12.1 A 7nm 256Mb SRAM in high-k metal-gate FinFET technology with write-assist circuitry for low-VMIN applications., , , , , , , , , and 6 other author(s). ISSCC, page 206-207. IEEE, (2017)A 5GHz 7nm L1 cache memory compiler for high-speed computing and mobile applications., , , , , and . ISSCC, page 200-201. IEEE, (2018)Electromigration failure rate of redundant via., , and . IRPS, page 1. IEEE, (2018)Product-level reliability estimator with budget-based reliability management in 20nm technology., , , , , , and . IRPS, page 6. IEEE, (2015)SE1: What Technologies Will Shape the Future of Computing?, , , , , , , , , and . ISSCC, page 537-538. IEEE, (2021)Gesture Recognition in the Haptic Creature., , and . EuroHaptics (1), volume 6191 of Lecture Notes in Computer Science, page 385-391. Springer, (2010)Location3: How Users Share and Respond to Location-Based Data on Social., and . ICWSM, The AAAI Press, (2011)Estimation of Product Reliability using TDDB Simulation and Statistical EM Method., , and . IRPS, page 1-6. IEEE, (2020)FinFET CMOS logic gates with non-volatile states for reconfigurable computing systems., , , , , and . Integr., (2019)A 7-nm Compute-in-Memory SRAM Macro Supporting Multi-Bit Input, Weight and Output and Achieving 351 TOPS/W and 372.4 GOPS., , , , , , , , and . IEEE J. Solid State Circuits, 56 (1): 188-198 (2021)