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Aging and Soft Error Resilience in Reconfigurable CNN Accelerators Employing a Multi-Purpose On-Chip Sensor.

, , , , and . LATS, page 1-6. IEEE, (2024)

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Time Management for Low-Power Design of Digital Systems., , , , , , and . J. Low Power Electron., 4 (3): 410-419 (2008)Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip., , , , , and . J. Electron. Test., 21 (4): 349-363 (2005)Bits, Flips and RISCs., , , , , , , , , and 3 other author(s). DDECS, page 140-149. IEEE, (2023)Recent Improvements on the Specification of Transient-Fault Tolerant VHDL Descriptions: A Case-Study for Area Overhead Analysis., and . SBCCI, page 249-254. IEEE Computer Society, (2000)Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity., , , , , , , , and . LATW, page 1-6. IEEE, (2011)Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG., , , , , , , , , and 1 other author(s). LATS, page 1-6. IEEE Computer Society, (2015)A New Approach to Guarantee Critical Task Schedulability in TDMA-Based Bus Access of Multicore Architecture., , , , , , and . LATS, page 1-6. IEEE, (2019)Experimental Results of a Recovery Block Scheme to Handle Noise in Speech Recognition Systems., , and . Asian Test Symposium, page 224-229. IEEE Computer Society, (2002)On-chip aging sensor to monitor NBTI effect in nano-scale SRAM., , , and . DDECS, page 354-359. IEEE, (2012)A Hardware-Scheduler for Fault Detection in RTOS-Based Embedded Systems., , and . DSD, page 341-347. IEEE Computer Society, (2009)