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State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines., , , и . DFT, стр. 1-6. IEEE, (2019)Designing area-efficient controllers for multi-cycle transient fault tolerant systems., , , и . ETS, стр. 1-2. IEEE, (2015)Reliability Analysis of Approximate Multipliers with Recovery Schemes., , , и . ATS, стр. 1-6. IEEE, (2023)State assignment for fault tolerant stochastic computing with linear finite state machines., , , и . ITC-Asia, стр. 156-161. IEEE, (2017)An Improvement of the No-Reference Test Scheme Based on False Edge Detection for Image Processing Application., , и . ITC-Asia, стр. 90-95. IEEE, (2022)Modeling economics of LSI design and manufacturing for test design selection., , , и . ICCD, стр. 516-517. IEEE Computer Society, (2012)A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-Test., , , и . Asian Test Symposium, стр. 85-90. IEEE Computer Society, (2013)A Fast Threshold Test Generation Algorithm Based on 5-Valued Logic., , , и . DELTA, стр. 345-349. IEEE Computer Society, (2010)TAM Design and Optimization for Transparency-Based SoC Test., , , , и . VTS, стр. 381-388. IEEE Computer Society, (2007)A Design of Reliable Linear FSMs with Equivalent States in Stochastic Computing., , и . DFT, стр. 1-6. IEEE, (2021)