Author of the publication

Making predictive analog/RF alternate test strategy independent of training set size.

, , , , , , and . ITC, page 1-9. IEEE Computer Society, (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Accurate and efficient analytical electrical model of antenna for NFC applications., , , , , , , and . NEWCAS, page 1-4. IEEE, (2013)Which metrics to use for RF indirect test strategy?, , , , , and . SMACD, page 73-76. IEEE, (2019)Estimating Static Parameters of A-to-D Converters from Spectral Analysis., , , , , and . LATW, page 174-179. IEEE, (2002)Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions., , , , , and . ETS, page 1-2. IEEE, (2017)A-to-D converters static error detection from dynamic parameter measurement., , , , and . Microelectron. J., 34 (10): 945-953 (2003)A New Methodology For ADC Test Flow Optimization., , , , and . ITC, page 201-209. IEEE Computer Society, (2003)MIRID: Mixed-Mode IR-Drop Induced Delay Simulator., , , , , and . Asian Test Symposium, page 177-182. IEEE Computer Society, (2013)Electrical Behavior of GOS Fault affected Domino Logic Cell., , , and . DELTA, page 183-189. IEEE Computer Society, (2006)Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations., , , , and . ISVLSI, page 164-169. IEEE Computer Society, (2016)Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies., , , , and . J. Electron. Test., 35 (1): 59-75 (2019)