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A virtual metrology system for semiconductor manufacturing., , , , , , и . Expert Syst. Appl., 36 (10): 12554-12561 (2009)Cost-free adversarial defense: Distance-based optimization for model robustness without adversarial training., , и . Comput. Vis. Image Underst., (января 2023)DSTEA: Dialogue State Tracking with Entity Adaptive Pre-training., , , , , и . CoRR, (2022)Mismatch between Multi-turn Dialogue and its Evaluation Metric in Dialogue State Tracking., , , , и . ACL (2), стр. 297-309. Association for Computational Linguistics, (2022)Recurrent neural network-based semantic variational autoencoder for Sequence-to-sequence learning., , и . Inf. Sci., (2019)Implementing Scientific Simulations on GPU-accelerated Edge Devices., и . ICOIN, стр. 756-760. IEEE, (2020)Machine learning-based novelty detection for faulty wafer detection in semiconductor manufacturing., , , , и . Expert Syst. Appl., 39 (4): 4075-4083 (2012)Training-free retrieval-based log anomaly detection with pre-trained language model considering token-level information., , , и . Eng. Appl. Artif. Intell., (2024)EUS SVMs: Ensemble of Under-Sampled SVMs for Data Imbalance Problems., и . ICONIP (1), том 4232 из Lecture Notes in Computer Science, стр. 837-846. Springer, (2006)Avoid Wasted Annotation Costs in Open-set Active Learning with Pre-trained Vision-Language Model., и . CoRR, (2024)