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A virtual metrology system for semiconductor manufacturing., , , , , , and . Expert Syst. Appl., 36 (10): 12554-12561 (2009)Cost-free adversarial defense: Distance-based optimization for model robustness without adversarial training., , and . Comput. Vis. Image Underst., (January 2023)DSTEA: Dialogue State Tracking with Entity Adaptive Pre-training., , , , , and . CoRR, (2022)Mismatch between Multi-turn Dialogue and its Evaluation Metric in Dialogue State Tracking., , , , and . ACL (2), page 297-309. Association for Computational Linguistics, (2022)Recurrent neural network-based semantic variational autoencoder for Sequence-to-sequence learning., , and . Inf. Sci., (2019)Machine learning-based novelty detection for faulty wafer detection in semiconductor manufacturing., , , , and . Expert Syst. Appl., 39 (4): 4075-4083 (2012)EUS SVMs: Ensemble of Under-Sampled SVMs for Data Imbalance Problems., and . ICONIP (1), volume 4232 of Lecture Notes in Computer Science, page 837-846. Springer, (2006)Implementing Scientific Simulations on GPU-accelerated Edge Devices., and . ICOIN, page 756-760. IEEE, (2020)Corrigendum to "Recurrent neural network-based semantic variational autoencoder for Sequence-to-sequence learning" Information Sciences 490 (2019) 59-73., , and . Inf. Sci., (2020)The effects of different alphabets on free text keystroke authentication: A case study on the Korean-English users.. J. Syst. Softw., (2015)