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Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment., , , , , , , , , and 1 other author(s). IRPS, page 7. IEEE, (2022)Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology., , , , , , and . IRPS, page 1-5. IEEE, (2020)Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems., , , , , , , , , and 1 other author(s). IRPS, page 1-7. IEEE, (2024)Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology., , , , , and . IRPS, page 1-5. IEEE, (2021)Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node., , , , , and . IRPS, page 1-5. IEEE, (2021)Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node., , , , , , , and . IRPS, page 1-5. IEEE, (2020)Networking industry trends in ESD protection for high speed IOs., , and . ASICON, page 1-4. IEEE, (2013)High-Current State triggered by Operating-Frequency Change., , , , , , and . IRPS, page 1-4. IEEE, (2020)Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System., , , , , and . IRPS, page 1-6. IEEE, (2020)