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Design and measurements of low power 32-kHz oscillators and a test interface in 180-nm CMOS technology.

I. Kuljak, I. Tomic, R. Bertolan, J. Mikulic, G. Schatzberger, J. Fellner, and A. Baric. MIPRO, page 83-88. IEEE, (2020)

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Gregor Hoffmann

Gregor Fahrenholz

Gregor Werner

Gregor Damschen

Gregor Wenzel

Other publications of authors with the same name

Variation and failure characterization through pattern classification of test data from multiple test stages.C. Hsu, P. Sarson, G. Schatzberger, F. Leisenberger, J. Jr., S. Siddhartha, and K. Cheng. ITC, page 1-10. IEEE, (2016)Design Methodology of an On-Chip Inductor in 180 nm CMOS Technology.I. Brezovec, J. Mikulic, G. Schatzberger, and A. Baric. MIPRO, page 65-69. IEEE, (2019)Design of CMOS Temperature Sensors Based on Ring Oscillators in 180-nm and 110-nm technology.I. Tolic, J. Mikulic, G. Schatzberger, and A. Baric. MIPRO, page 104-108. IEEE, (2020)Analysis of Wheatstone Bridge Sensitivity for Applications in Integrated Piezoresistive Stress Sensors.L. Gocan, A. Zamboki, J. Mikulic, G. Schatzberger, J. Fellner, T. Markovic, and A. Baric. MIPRO, page 1637-1642. IEEE, (2024)Measurement System for Characterization of a Resistor Array in 180-nm CMOS Technology.I. Frankovic, F. Mikic, J. Mikulic, N. Bako, G. Schatzberger, and A. Baric. MIPRO, page 202-207. IEEE, (2023)Relaxation oscillator calibration technique with comparator delay regulation.J. Mikulic, G. Schatzberger, and A. Baric. MIPRO, page 57-61. IEEE, (2016)Characterization of measurement system for high-precision oscillator measurements.I. Brezovec, M. Magerl, J. Mikulic, G. Schatzberger, and A. Baric. MIPRO, page 88-92. IEEE, (2017)Low-Power Frequency-Locked Loop Circuit with Short Settling Time.A. Zamboki, L. Gocan, N. Bako, J. Mikulic, G. Schatzberger, and A. Baric. MIPRO, page 174-179. IEEE, (2022)Scalable High Voltage CMOS technology for Smart Power and sensor applications.M. Schrems, M. Knaipp, H. Enichlmair, V. Vescoli, R. Minixhofer, E. Seebacher, F. Leisenberger, E. Wachmann, G. Schatzberger, and H. Gensinger. Elektrotech. Informationstechnik, 125 (4): 109-117 (2008)A Non-Volatile Embedded Memory for High Temperature Automotive and High-Retention Applications.M. Thomas, J. Pathak, J. Payne, F. Leisenberger, E. Wachmann, G. Schatzberger, A. Wiesner, and M. Schrems. ISQED, page 591-596. IEEE Computer Society, (2006)

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Disambiguation of "Schatzberger, Gregor"

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Design and measurements of low power 32-kHz oscillators and a test interface in 180-nm CMOS technology.

Please choose a person to relate this publication to

Gregor Hoffmann

Gregor Fahrenholz

Gregor Werner

Gregor Damschen

Gregor Wenzel

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Schatzberger, Gregor"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Design and measurements of low power 32-kHz oscillators and a test interface in 180-nm CMOS technology.

Please choose a person to relate this publication to

Gregor Hoffmann

Gregor Fahrenholz

Gregor Werner

Gregor Damschen

Gregor Wenzel

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Design and measurements of low power 32-kHz oscillators and a test interface in 180-nm CMOS technology.