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Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits.

, , , и . ICCAD, стр. 795-802. IEEE, (2013)

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Yü-Sün Sun

Hongqing Sun

Haiyan Sun

Hongtao Sun

Guolin Sun

 

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Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits., , и . CICC, стр. 1-4. IEEE, (2013)Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits., , , и . ICCAD, стр. 795-802. IEEE, (2013)Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space., и . ASP-DAC, стр. 302-307. IEEE, (2015)Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion., , , , , , , , , и 4 other автор(ы). CICC, стр. 1-4. IEEE, (2013)A statistical methodology for noise sensor placement and full-chip voltage map generation., , , , и . DAC, стр. 94:1-94:6. ACM, (2015)Nonlinear Dynamic Modeling and Model Reduction Strategy for Rotating Thin Cylindrical Shells., и . Complex., (2019)Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space., , , , и . ICCAD, стр. 478-485. IEEE, (2013)Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data., , , , и . DAC, стр. 64:1-64:6. ACM, (2013)Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space., и . CICC, стр. 1-4. IEEE, (2015)Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space., и . ICCAD, стр. 324-331. IEEE, (2014)