Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Issues in Optimizing the Test Process - A Telecom Case Study., , and . ITC, page 800-808. IEEE Computer Society, (1996)OCI: Open Compression Interface., , , , , , , , and . ITC, page 1-4. IEEE Computer Society, (2006)IEEE 1149.1: How to Justify Implementation.. ITC, page 265. IEEE Computer Society, (1993)Defects, Fault Coverage, Yield and Cost in Board Manufacturing., and . ITC, page 539-547. IEEE Computer Society, (1994)ASIC Yield Estimation at Early Design Cycle., , and . ITC, page 590-594. IEEE Computer Society, (1996)Opens Board Test Coverage: When is 99% Really 40%?, , and . ITC, page 333-339. IEEE Computer Society, (1996)ASIC Manufacturing Test Cost Prediction at Early Design Stage., , and . ITC, page 356-361. IEEE Computer Society, (1997)A new methodology for improved tester utilization., , , , , and . ITC, page 916-923. IEEE Computer Society, (2001)Manufacturing-Test Simulator: A Concurrent-Engineering Tool for Boards and MCMs., and . ITC, page 903-910. IEEE Computer Society, (1994)Board Test DFT Model for Computer Products., , and . ITC, page 367-371. IEEE Computer Society, (1992)