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Disambiguation of "Uzzaman, Anis"

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Not all Delay Tests Are the Same - SDQL Model Shows True-Time.

, , , , , and . ATS, page 147-152. IEEE, (2006)

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Siegfried Anisch

Muhammad Anis

Luc Aniset

Natalia Anisimova

Helene Anissi

 

Other publications of authors with the same name

Not all Delay Tests Are the Same - SDQL Model Shows True-Time., , , , , and . ATS, page 147-152. IEEE, (2006)Test Roles in Diagnosis and Silicon Debug., , , , , , and . ATS, page 367. IEEE, (2007)Optimizing Test Data Volume Using Hybrid Compression., , , , and . ATS, page 157-162. IEEE Computer Society, (2008)Is Low Power Testing Necessary? What does the Test Industry Truly Need?.. Asian Test Symposium, page 215-216. IEEE Computer Society, (2009)Using Programmable On-Product Clock Generation (OPCG) for Delay Test., , , and . ATS, page 69-72. IEEE, (2007)Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis., , , , , , , , , and . ATS, page 415-420. IEEE, (2006)Why is Conventional ATPG Not Sufficient for Advanced Low Power Designs?., , , , and . Asian Test Symposium, page 295-300. IEEE Computer Society, (2009)Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation., , , , and . ITC, page 1-10. IEEE Computer Society, (2007)How To Increase the Effectiveness of Yield Diagnostics-Is DFM the Answer to This?. ATS, page 221. IEEE Computer Society, (2008)A Partially-Exhaustive Gate Transition Fault Model., , , and . Asian Test Symposium, page 361-364. IEEE Computer Society, (2009)