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Path delay test compaction with process variation tolerance., , , , , and . DAC, page 845-850. ACM, (2005)A Statistical Quality Model for Delay Testing., , , , and . IEICE Trans. Electron., 89-C (3): 349-355 (2006)Not all Delay Tests Are the Same - SDQL Model Shows True-Time., , , , , and . ATS, page 147-152. IEEE, (2006)Invisible delay quality - SDQM model lights up what could not be seen., , , , , and . ITC, page 9. IEEE Computer Society, (2005)Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects., , , , , , , , , and . ATS, page 139-146. IEEE, (2006)Recognition of Sensitized Longest Paths in Transition Delay Test., , , , and . ITC, page 1-6. IEEE Computer Society, (2006)A Framework of High-quality Transition Fault ATPG for Scan Circuits., , , , , , and . ITC, page 1-6. IEEE Computer Society, (2006)Evaluation of the statistical delay quality model., , , , and . ASP-DAC, page 305-310. ACM Press, (2005)A dynamic test compaction procedure for high-quality path delay testing., , , , , and . ASP-DAC, page 348-353. IEEE, (2006)