( en | de | ru )

 

Disambiguation of "Lanza, Mario"

Author of the publication

copydeleteadd this publication to your clipboard
Enhanced reliability of hexagonal boron nitride dielectric stacks due to high thermal conductivity.

, , , , , , and . IRPS, page 6-1. IEEE, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Giovanni Lanza

Gisela Lanza

Edoardo Giuseppe Lanza

Gisela Lanza

Marco Lanza

 

Other publications of authors with the same name

Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages., , , , , , , , , and 3 other author(s). IRPS, page 1-5. IEEE, (2020)Enhanced reliability of hexagonal boron nitride dielectric stacks due to high thermal conductivity., , , , , , and . IRPS, page 6-1. IEEE, (2018)Trapped charge and stress induced leakage current (SILC) in tunnel SiO2 layers of de-processed MOS non-volatile memory devices observed at the nanoscale., , , , , and . Microelectron. Reliab., 49 (9-11): 1188-1191 (2009)Variability in Resistive Memories., , , , , , , , , and 10 other author(s). Adv. Intell. Syst., (June 2023)Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks., , , , , , , , and . IRPS, page 1-5. IEEE, (2020)Equivalent circuit model for the electron transport in 2D resistive switching material systems., , , , , and . ESSDERC, page 86-89. IEEE, (2017)2021 Roadmap on Neuromorphic Computing and Engineering., , , , , , , , , and 46 other author(s). CoRR, (2021)Nanoscale observations of resistive switching high and low conductivity states on TiN/HfO2/Pt structures., , , , , , , , , and 1 other author(s). Microelectron. Reliab., 52 (9-10): 2110-2114 (2012)Time series modeling of the cycle-to-cycle variability in h-BN based memristors., , , , , , , , and . IRPS, page 1-5. IEEE, (2021)Tristate Resistive Switching in Heterogenous Van Der Waals Dielectric Structures., , , , , , , , , and . IRPS, page 1-6. IEEE, (2019)