Author of the publication

A Probability Soft-Error Model for a 28-nm SRAM-based FPGA under Neutron Radiation Exposure

, , , , , and . 2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), page 1-5. (April 2023)
DOI: 10.1109/EuroSimE56861.2023.10100757

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Radiation Tolerant Reconfigurable Hardware Architecture Design Methodology., , , , , , and . ARC, volume 14251 of Lecture Notes in Computer Science, page 357-360. Springer, (2023)SRAM Test Chip for Radiation Experiment, , , , , and . Pan Pacific Symposium 2022, (2022)A Probability Soft-Error Model for a 28-nm SRAM-based FPGA under Neutron Radiation Exposure, , , , , and . 2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), page 1-5. (April 2023)Radiation Tolerant Reconfigurable Hardware Architecture Design Methodology, , , , , , and . Applied Reconfigurable Computing. Architectures, Tools, and Applications, page 357--360. Cham, Springer Nature Switzerland, (2023)Investigation of FPGA and SRAM Cells Under Radiation Exposure, , , and . 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), page 1-5. (April 2022)